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IMAPS Global Business Council Roadmap Process

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IMAPS Global Business Council Roadmap Process

اسلاید 1: IMAPS Global Business Council Roadmap Process“The Road Ahead”

اسلاید 2: The GBC Roadmap TeamThis Roadmap Process presentation was prepared by these members of the IMAPS Global Business Council & National Technology Council:Steve Adamson (sadamson@asymtek.com)Justin Blount (Justin.M.Blount@usa.dupont.com)Laurie Roth (lroth@kns.com)Lee Smith (lsmit@amkor.com)Andy Strandjord (andrew.strandjord@flipchip.com)Jie Xue (jixue@cisco.com)

اسلاید 3: TopicsWhere does IMAPS fit in with the ITRS and iNEMI Roadmaps?What is the ITRS Roadmap and how does it work?What is the iNEMI Roadmap and how does it work?How does IMAPS interact with this Roadmap Process?Why IMAPS should be involved.IMAPS Areas of Focus.If you are already familiar with the ITRS & iNEMI Roadmap Process, skip to slide 19 The Roadmaps:ITRSiNEMISummary IMAPS Areas of Focus.

اسلاید 4: Market RequirementsTech RequirementsiNEMIITRSChip LevelSystem LevelITRS & iNEMI Packaging Roadmaps IntersectIMAPS addresses the Semiconductor Packaging needs of this space.

اسلاید 5: What is the ITRS?The International Technology Roadmap for Semiconductors (ITRS) is an assessment of semiconductor technology requirements. The objective of the ITRS is to ensure advancements in the performance of integrated circuits. This assessment, called roadmapping, is a cooperative effort of global industry manufacturers and suppliers, government organizations, consortia, and universities. The ITRS identifies the technological challenges and needs facing the semiconductor industry over the next 15 years. It is sponsored by the European Semiconductor Industry Association (ESIA), the Japan Electronics and Information Technology Industries Association (JEITA), the Korean Semiconductor Industry Association (KSIA), the Semiconductor Industry Association (SIA), and Taiwan Semiconductor Industry Association (TSIA). SEMATECH is the global communication center for this activity. The ITRS team at SEMATECH also coordinates the USA region events. http://public.itrs.net/

اسلاید 6: ITRS Technology Working GroupsThe ITRS process encourages discussion and debate throughout the community about the requirements for success. The key factor in the success of the Roadmap is obtaining consensus on industry drivers, requirements, and technology timelines.The Technology Working Groups are the organizations that build the roadmaps. These representatives assess the state of technology and identify areas that may provide solutions. The TWG members also indicate opportunities for new research and innovation. These groups are made up of volunteer technology experts from chip manufactures, supplier companies, universities and academia, technology labs, and semiconductor technology consortia. The Technology Working Groups, also known as TWGs, are comprised of the technical disciplines of System DriversDesignTest and Test EquipmentProcess Integration, Devices, and StructuresRF and Analog/Mixed-signal Technologies for Wireless CommunicationsEmerging Research Devices and MaterialsFront End ProcessesLithographyInterconnectFactory IntegrationAssembly and Packaging – This is the area where IMAPS will focus.Environment, Safety, and HealthYield EnhancementMetrologyModeling and Simulation.

اسلاید 7: Example of ITRS Short Term Challenges

اسلاید 8: iNEMI has strong industry support.

اسلاید 9: iNEMI Roadmap MethodologyiNEMI focusses on top level industry segments via their Product Emulator Groups.In addition, they address technology areas via their different Technology Working Groups.A “cross-cut” matrix ensures feedback between the various groups.

اسلاید 10: iNEMI Technology Working Groups Business Processes/Technologies: Product Lifecycle Information Management Design Technologies: Environmentally Conscious ElectronicsModeling, Simulation & Design Tools Thermal Management Manufacturing Technologies:Board AssemblyTest, Inspection & Measurement Final Assembly Component Subsystem Technologies: Passive ComponentsRF Components & Subsystems Packaging – This is one of the areas where IMAPS will focus.Semiconductor TechnologyOrganic Substrates Mass Data StorageConnectorsEnergy Storage SystemsOptoelectronicsSensorsOrganic and Printed ElectronicsCeramic Substrates – IMAPS also contributes to this TWG.

اسلاید 11: iNEMI Cross-cut MatrixA “cross-cut” matrix ensures feedback between the various groups.

اسلاید 12: Example of iNEMI short term challenges

اسلاید 13: Update calendar for ITRS / iNEMI2006 ITRS Roadmap release scheduled for December 4, 2006.2007 iNEMI Roadmap release scheduled for February 2007 at APEX, Los Angeles.

اسلاید 14: Why IMAPS should be involved.ITRS focuses mainly on “front end” wafer fab areas, with a chapter on Semiconductor Assembly & Packaging.iNEMI focuses mainly on “board level” assembly, with a chapter on Semiconductor Assembly & Packaging.ITRS/iNEMI are working together to align their Semiconductor Assembly & Packaging Roadmaps.Many of the same people are on both teams.Some IMAPS members are also on both teams.IMAPS’ focus is on Semiconductor Assembly & Packaging.It’s a natural fit to take the output of the ITRS/iNEMI Semiconductor Assembly & Packaging Roadmaps and use that output to direct IMAPS’ activities towards solving gaps in the roadmap.IMAPS’ corporate members will benefit by developing real industry solutions for real industry challenges.

اسلاید 15: Global Semiconductor Packaging Materials OutlookSource: SEMI Industry Research and Statistics and TechSearch International, November 2005This forecast was supplied courtesy of SEMI & Techsearch International. The full report is available from SEMI’s web catalog at www.semi.org .Market Size for Materials = Market Opportunities for IMAPS members.

اسلاید 16: Launched “The Road Ahead” in Advancing Microelectronics 4/06

اسلاید 17: Roll-out plan for IMAPS to address roadmapsForm a GBC Roadmap Team.- DONEGBC Roadmap Team creates a roadmap template (“red brick”) and identifies current gaps on the existing roadmaps. - DONEGBC Roadmap Team communicates those gaps to the NTC.GBC and NTC structure future IMAPS events to focus on those gaps – ongoing.Dave Saums to give short presentation at LED & Thermal ATWs in September 2006.Meantime, GBC/NTC to support ITRS/iNEMI updates with input & communicate back to IMAPS issues/trends.Use IMAPS members on the ITRS/iNEMI roadmap TWGs to facilitate communication: Laurie Roth, Howard Imhof....and other volunteers.Red Brick templateRed Brick templateRed Brick templateRed Brick templateRed Brick template 200620072008etc   X                       Manufacturing solutions exist and are being optimized.Manufacturing solutions exist and are being optimized.Manufacturing solutions exist and are being optimized.Manufacturing solutions exist and are being optimized.Manufacturing solutions exist and are being optimized. Manufacturing solutions are know.Manufacturing solutions are know.Manufacturing solutions are know.Manufacturing solutions are know. XInterim solutions are known.Interim solutions are known.Interim solutions are known.   Manufacturable solutions are NOT known.Manufacturable solutions are NOT known.Manufacturable solutions are NOT known.Manufacturable solutions are NOT known. 

اسلاید 18: Recommended Areas of Focus for IMAPS MembersDevelop Feasible Embedded Components.Develop Enhanced Materials to Enable Wafer Level Packaging.Bring Solutions to Resolve Thermal Management Issues.Develop New Materials to Reduce System Cost While Delivering the Necessary Performance.Close the Gap Between Chip and Substrate Interconnect Density.Resolve the issues low K and Cu bring to Packaging.

اسلاید 19: The Roadmaps

اسلاید 20: The complete chapter can be downloaded from the ITRS website: http://www.itrs.net/Common/2005ITRS/AP2005.pdf The following slides contain key excerpts.

اسلاید 21: ITRS 2005 Semiconductor Packaging Roadmap Table of ContentsChapter ScopeDifficult ChallengesTechnology RequirementsSingle Chip PackagesHigh Pin-Count PackagesWafer Level PackagingSystem in a Package (Multi-chip Packages, 3D Packaging) Flexible Substrates and InterconnectOptoelectronic PackagingRF PackagingMEMSMedical and Bio Chip PackagingBiocompatibilityBio Packaging ReliabilityIntegrated Circuit ManufacturingCost Reliability Package and Interconnect Characterization and Simulation SimulationReliability TestingSoft ErrorsPackaging Materials RequirementsNew MaterialsEmbedded and Integrated PassivesAssembly and Packaging Infrastructure ChallengesElectrical Design RequirementsCross TalkPower Distribution and Power SubsystemThermo-mechanical Challenges in Electronic PackagingMechanical ChallengesMechanical Modeling and Simulation and ValidationThermal Modeling and Simulation and ValidationEquipment Requirements for Emerging Package TypesPotential SolutionsWafer Level PackagingChip to Next Level InterconnectPackage to Board InterconnectFine Pitch Ball Grid Array/CSP PackagesSocketed PartsEmbedded and Integrated PassivesPackage SubstratesBuild-Up and Coreless SubstratesRigid Substrate TechnologyAll of these topics – and those on the next slide – are comprehensively covered in the ITRS Roadmap.This presentation will focus on the key challenges only.

اسلاید 22: ITRS 2005 Semiconductor Packaging Roadmap Table of Contents continuedSystem in Package (SiP) – System Level IntegrationTypes/Categories of SiP’sSide by Side Placement (Horizontal Packages) Stacked StructuresPackage-on-Package (POP), Package-in-Package (PiP) Stacked Die PackagesChip to Chip/Wafer Structure Embedded StructuresTechnologies for SiPWafer level SiP and 3 D Integration TechnologiesTechnologies for Embedded DevicesChallenges for SiPThermal managementSystem in Package OutlookWafer Thinning Glossary of TermsCross-Cut ITWG IssuesDesignFactory IntegrationDie Traceability Crosscut with Factory IntegrationInterconnectRF/AMS WirelessEnvironment, Safety and HealthModeling and SimulationMetrologyTest

اسلاید 23: ITRS: Single Chip PackageIncremental improvements in traditional assembly technologies will not be sufficient to meet market requirements. The substrate dominates the cost of single chip packaging.Cost per pin has been trending up, instead of down.Operating temperatures are a problem in harsh environments.Higher frequency chip-to-board speeds for peripheral buses.

اسلاید 24: ITRS: High Pin-Count PackagesPackage pin count grows as higher frequency and higher power density demand more power and ground pins.Substrate technology requires micro-vias, blind & buried vias, stacked vias and tighter lines and spacing.Substrate technology advances lead to significant cost increases for design/test and a reduced supplier base.System-in-Package will become more important to reduce the need for high density interconnects in the package substrate and the PCB.

اسلاید 25: ITRS: Chip-to-Package SubstrateDevelopment work is required for finer pitch in-line wire bond & area array flip chip.

اسلاید 26: ITRS: Package Substrate Physical Properties – Near Term

اسلاید 27: ITRS: Package Substrate Physical Properties – Long Term

اسلاید 28: SiP enables reduction in size, weight, cost & power.System-on-Chip can address size, weight & power, but at cost, design & test premiums.SiP integrates multiple functions/devices in a single package.Can integrate different elements such as MEMS, opto, bio....Includes 3D “stacked die” packaging.Requires Known Good Die.ITRS: System-in-Package - definitionsSoC and SiP Comparison for Cost per Function and Time to Market vs. Complexity

اسلاید 29: ITRS: System-in-Package RequirementsThe number of stacked die and the number of die in a SiP are challenges.

اسلاید 30: ITRS: Thinned WafersLong term challenge for extreme thin packages.

اسلاید 31: ITRS: Wafer Level PackagingNear term challenges:I/O pitch between 150 µm - 250 µm >100 I/OSolder joint reliabilityWafer thinning and handling technologiesCompact ESD structuresTCE mismatch compensation for large die

اسلاید 32: ITRS: Flexible SubstratesNear term challenges:Conformal low cost organic substratesSmall and thin die assemblyHandling in low cost operation

اسلاید 33: ITRS: InterconnectIt is very challenging to maintain packaging reliability with strong chip-to-package interaction resulting from new materials, new processes, and new interconnect features at the Si level.

اسلاید 34: ITRS: Interconnect (cont’d)

اسلاید 35: ITRS: Optoelectronic PackagingPackage SealingHermetic sealing to protect the optical devices - TO header & butterfly packaging. Non-hermetically sealed organic packaging for cost sensitive applications.Alignment < 0.5 µm alignment between single mode fiber & optical device for high data rate applications. 5 to 10 µm alignment accuracy for cost sensitive applications, using relatively large diameter polymer optical fiber (POF) Adhesive to assure alignment through succeeding high temperature processes & product usage life. MaterialsPOF material improvement in attenuation reduction and data rate increase is required. Material development for poly-clad-silica (PCS) fiber.Optically clear molding compound or clear glob tops for optical windows.Vertical integration to include more functionality in a package. Wafer-level-packaging (WLP) process to integrate lenses or other micro-opticalelectro-mechanical system (MOEMS) devices, and to provide environmental protection for a VCSEL wafer.Some micro-optical components, e.g. polymer waveguides and beam reflectors, may be embedded in the SiP substrate. A BGA based SiP may house optical connectors, laser diodes, photodetectors, CMOS IC containing receivers/drivers and multiplexer/demultiplexer, plus RF connectors, and decoupling capacitors.

اسلاید 36: ITRS: RF PackagingMany of the technology challenges for RF packaging arise from the fact that the IC packaging engineering practice, technology knowledge base, and manufacturing infrastructures have been based upon digital IC packaging developed in the last forty odd years. IssuesThe inductance characteristics associated with bonding wires and leaded packages, and effect of molding compound materials limit the RF performance. RF package modeling tools and materials properties database for package design and device-package co-design for the broad spectrum of RF market applications. Improvements in materials properties—molding compounds, underfills, substrates are required.Being able to embed passive components in LTCC. To meet the low cost challenges, embedded inductance and capacitance components and networks in organic packaging for RF applications must be diligently pursued. Tools to enable device package co-design in SIP packages will be very important.

اسلاید 37: ITRS: MEMS

اسلاید 38: ITRS: Medical & Bio Chip PackagingBIOCOMPATIBILITYNo interaction with body tissues and fluids.No inflammatory reactions.No toxicity to bio-organisms.No outgassing or other decay products that may be harmful to bio-organisms. Must be chemically inert to various concentrations of bio-reagents including ethanol. May include high flow rates with significant back pressure.BIO PACKAGING RELIABILITYMajor concerns are patient safety and risk mitigation. For life-sustaining devices, component failure rate as low as 100 ppm, few ppm critical failure rate. Challenge to capture low occurrence failures in reliability testing. EMI is a major concern. Pressure requirements: in a barometric pressure chamber or while scuba diving.Defibrillation devices could generate significant localized heating in the high voltage charging circuit when delivering therapy, challenging the package substrate and PCB. MANUFACTURINGIn accordance with regulatory requirements for medical devicesRequirements for control of the manufacturing environment, labeling of the packages, and documentation.

اسلاید 39: ITRS: CostToday packaging costs often exceed die fabrication costs.Leadfree solders.Low K & High K dielectrics.Higher processing temperatures.Wider range of environmental temperatures.More efficient thermal management needed.

اسلاید 40: ITRS: Reliability & SimulationThe introduction of the new materials and structures to meet environmental, heat and speed requirements are posing new reliability challenges. New technology will be required to meet the reliability goals including:New reliability tests such as drop tests for mobile products.Correlation between field- and laboratory testing.Improved methods for failure detection and analysis (e.g., X-ray, acoustic, nano-deformation and localized residual stress measurement.)Materials and interface characterization. Interfacial delamination will continue to be a critical reliability hazard that is worsened by the trends to larger chips, new materials and increased layer count. More layers require the understanding of more interfaces.Simulation and modeling for life time prediction (e.g., multi-field coupling, structure-property correlation, ab-initio methods, modular and parametric approaches).New failure modes caused by new materials needed to meet environmental and performance requirements, result in significant challenges in field reliability prediction based on accelerated lab testing for broad product application field requirements.

اسلاید 41: ITRS: Packaging Materials

اسلاید 42: ITRS: InfrastructureElectrical designCross talkPower distribution & power subsystemThermo-mechanicalModeling & SimulationEquipment

اسلاید 43: The iNEMI Roadmap is only available for download to TWG members or on-line purchase.The following slides contain key excerpts from the 2007 Roadmap Update-in-progess.www.inemi.org

اسلاید 44:

اسلاید 45:

اسلاید 46:

اسلاید 47:

اسلاید 48: Recommended Areas of Focus for IMAPS Members SummaryDevelop Feasible Embedded Components.Develop Enhanced Materials to Enable Wafer Level Packaging.Bring Solutions to Resolve Thermal Management Issues.Develop New Materials to Reduce System Cost While Delivering the Necessary Performance.Close the Gap Between Chip and Substrate Interconnect Density.Resolve the issues low K and Cu bring to Packaging.

اسلاید 49: Back Up

اسلاید 50: ITRS: Difficult Challenges ≥ 32 nm – Near TermThe ITRS Roadmap segments issues into those that are Near Term & affect Wafer Nodes ≥ 32 nm and those that are Long Term & affect Wafer Nodes <32 nm.

اسلاید 51: ITRS: Difficult Challenges ≥ 32 nm – Near Term

اسلاید 52: ITRS: Difficult Challenges ≥ 32 nm – Near Term

اسلاید 53: ITRS: Difficult Challenges ≥ 32 nm – Near Term

اسلاید 54: ITRS: Difficult Challenges < 32 nm – Long Term

10,000 تومان

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